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"Effects of stress-loading test methods on the degradation of ..."

Miao Cai et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Miao Cai, Dao-Guo Yang, Jianna Zheng, Jianlin Huang, Dongjing Liu, Jing Xiao, Ping Zhang, Guoqi Zhang, Xianping Chen:
Effects of stress-loading test methods on the degradation of light-emitting diode modules. Microelectron. Reliab. 64: 635-639 (2016)

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