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"An examination of the applicability of the DNP metric on first level ..."

W. Dauksher, W. S. Burton (2003)

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DOI: 10.1016/S0026-2714(03)00219-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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W. Dauksher, W. S. Burton:
An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages. Microelectron. Reliab. 43(12): 2011-2020 (2003)

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