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"Wide band gap semiconductor reliability : Status and trends."

Sylvain L. Delage, Christian Dua (2003)

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DOI: 10.1016/S0026-2714(03)00338-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sylvain L. Delage, Christian Dua:
Wide band gap semiconductor reliability : Status and trends. Microelectron. Reliab. 43(9-11): 1705-1712 (2003)

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