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"Limitations to photon-emission microscopy when applied to "hot" devices."

Hervé Deslandes, Ted R. Lundquist (2003)

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DOI: 10.1016/S0026-2714(03)00291-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/DeslandesL03
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  - https://dblp.org/rec/journals/mr/DeslandesL03
Hervé Deslandes, Ted R. Lundquist:
Limitations to photon-emission microscopy when applied to "hot" devices. Microelectron. Reliab. 43(9-11): 1645-1650 (2003)

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