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"Emitter-metal-related degradation in InP-based HBTs operating at high ..."
Yoshino K. Fukai et al. (2009)
- Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki:
Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal. Microelectron. Reliab. 49(4): 357-364 (2009)
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