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"Effects of SiO2 film thickness and operating temperature on ..."
Chang-Fu Han et al. (2018)
- Chang-Fu Han, Yi-Zhe Guo, Chung-Jen Chung, Chang-Hong Shen, Jen-Fin Lin
:
Effects of SiO2 film thickness and operating temperature on thermally-induced failures in through-silicon-via structures. Microelectron. Reliab. 83: 1-13 (2018)
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