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"Towards understanding recovery of hot-carrier induced degradation."

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz (2018)

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DOI: 10.1016/J.MICROREL.2018.07.057

access: closed

type: Journal Article

metadata version: 2021-10-14

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Maurits J. de Jong, Cora Salm, Jurriaan Schmitz:
Towards understanding recovery of hot-carrier induced degradation. Microelectron. Reliab. 88-90: 147-151 (2018)

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