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"Thermally driven reliability issues in microelectronic systems: status-quo ..."

Clemens J. M. Lasance (2003)

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DOI: 10.1016/S0026-2714(03)00183-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Clemens J. M. Lasance:
Thermally driven reliability issues in microelectronic systems: status-quo and challenges. Microelectron. Reliab. 43(12): 1969-1974 (2003)

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