"Erratum to "A simple and fundamental design rule for resisting ..."

Thomas D. Moore, John L. Jarvis (2003)

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DOI: 10.1016/S0026-2714(03)00116-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Thomas D. Moore, John L. Jarvis:
Erratum to "A simple and fundamental design rule for resisting delamination in bimaterial structures" [Microelectronics Reliability 2003;43: 487-494]. Microelectron. Reliab. 43(7): 1169 (2003)

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