"Influence of temperature and dose rate on the degradation of BiCMOS ..."

Aleksandr S. Petrov, Konstantin I. Tapero, Viktor N. Ulimov (2014)

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DOI: 10.1016/J.MICROREL.2014.07.091

access: closed

type: Journal Article

metadata version: 2020-02-22

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Aleksandr S. Petrov, Konstantin I. Tapero, Viktor N. Ulimov:
Influence of temperature and dose rate on the degradation of BiCMOS operational amplifiers during total ionizing dose testing. Microelectron. Reliab. 54(9-10): 1745-1748 (2014)

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