"Evidence and modelling current dependence of defect generation probability ..."

G. Ribes et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.11.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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G. Ribes, S. Bruyère, M. Denais, David Roy, Gérard Ghibaudo:
Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown. Microelectron. Reliab. 45(5-6): 841-844 (2005)

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