"Accelerated degradation data of SiC MOSFETs for lifetime and Remaining ..."

Thomas Santini et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.082

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type: Journal Article

metadata version: 2023-09-30

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Thomas Santini, Sébastien Morand, Mitra Fouladirad, Luong-Viêt Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard:
Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectron. Reliab. 54(9-10): 1718-1723 (2014)

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