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"Early reliability assessment by using deep censoring."

Harry A. Schafft et al. (2003)

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DOI: 10.1016/S0026-2714(02)00241-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SchafftHGS03
Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan:
Early reliability assessment by using deep censoring. Microelectron. Reliab. 43(1): 1-16 (2003)

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