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"Dynamic lock-in thermography for operation mode-dependent thermally active ..."

Rudolf Schlangen et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.082

access: closed

type: Journal Article

metadata version: 2024-05-07

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Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li:
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectron. Reliab. 50(9-11): 1454-1458 (2010)

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