"Three-step concept (TSC) in modeling microelectronics reliability (MR): ..."

Ephraim Suhir (2014)

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DOI: 10.1016/J.MICROREL.2014.07.001

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type: Journal Article

metadata version: 2022-05-19

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Ephraim Suhir:
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models. Microelectron. Reliab. 54(11): 2594-2603 (2014)

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