"Predicting conducting yarn failure in woven electronic textiles."

Hans de Vries, Ron Peerlings (2014)

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DOI: 10.1016/J.MICROREL.2014.07.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hans de Vries, Ron Peerlings:
Predicting conducting yarn failure in woven electronic textiles. Microelectron. Reliab. 54(12): 2956-2960 (2014)

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