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"Detectability of automotive power MOSFET on-resistance failure at high ..."

Yann Weber, Julien Goxe, M. Castignolles (2013)

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DOI: 10.1016/J.MICROREL.2013.07.055

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yann Weber, Julien Goxe, M. Castignolles:
Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion. Microelectron. Reliab. 53(9-11): 1393-1398 (2013)

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