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"Investigation of high performance Edge Lifted Capacitors reliability for ..."

Ming-Hung Weng et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.09.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ming-Hung Weng, Chao-Hung Chen, Che-Kai Lin, Shih-Hui Huang, Jhih-Han Du, Sheng-Wen Peng, Walter Wohlmuth, Frank Yung-Shi Chou, Chang-Hwang Hua:
Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. Microelectron. Reliab. 54(12): 2697-2703 (2014)

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