"Methodology for predicting off-state reliability in GaN power transistors."

Charles S. Whitman (2014)

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DOI: 10.1016/J.MICROREL.2013.09.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Charles S. Whitman:
Methodology for predicting off-state reliability in GaN power transistors. Microelectron. Reliab. 54(2): 354-359 (2014)

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