"Investigation of enhanced low dose rate sensitivity in SiGe HBTs by ..."

Jinxin Zhang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.03.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jinxin Zhang, Qi Guo, Hongxia Guo, Wu Lu, Chaohui He, Xin Wang, Pei Li, Lin Wen:
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by ⁶⁰Co γ irradiation under different biases. Microelectron. Reliab. 84: 105-111 (2018)

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