"Remaining useful life prediction for stochastic degrading devices ..."

Jian-Xun Zhang et al. (2024)

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DOI: 10.1016/J.RESS.2024.110223

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type: Journal Article

metadata version: 2024-08-08

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Jian-Xun Zhang, Jia-Ling Zhang, Zheng-Xin Zhang, Tian-Mei Li, Xiao-Sheng Si:
Remaining useful life prediction for stochastic degrading devices incorporating quantization. Reliab. Eng. Syst. Saf. 250: 110223 (2024)

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