"A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits."

Ugur Kalay, Douglas V. Hall, Marek A. Perkowski (2000)

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DOI: 10.1109/12.841130

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/KalayHP00
Ugur Kalay, Douglas V. Hall, Marek A. Perkowski:
A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits. IEEE Trans. Computers 49(3): 267-276 (2000)

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