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"An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time."

Hyunggoy Oh et al. (2017)

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DOI: 10.1109/TC.2016.2561920

access: closed

type: Journal Article

metadata version: 2024-02-27

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/tc/OhHCK17
Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017)

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