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"Chaining and Biasing: Test Generation Techniques for Shared-Memory ..."

Gabriel A. G. Andrade, Marleson Graf, Luiz C. V. dos Santos (2020)

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DOI: 10.1109/TCAD.2019.2894376

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/AndradeGS20
Gabriel A. G. Andrade, Marleson Graf, Luiz C. V. dos Santos:
Chaining and Biasing: Test Generation Techniques for Shared-Memory Verification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(3): 728-741 (2020)

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