"Simulating the Electrical Behavior of Integrated Circuit Devices in the ..."

M. Capobianchi et al. (2006)

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DOI: 10.1109/TCAD.2005.859488

access: closed

type: Journal Article

metadata version: 2020-09-24

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M. Capobianchi, V. Labay, F. Shi, G. Mizushima:
Simulating the Electrical Behavior of Integrated Circuit Devices in the Presence of Thermal Interactions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2231-2241 (2006)

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