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"New and improved BIST diagnosis methods from combinatorial Group testing ..."

Andrew B. Kahng, Sherief Reda (2006)

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DOI: 10.1109/TCAD.2005.854635

access: closed

type: Journal Article

metadata version: 2020-09-24

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Andrew B. Kahng, Sherief Reda:
New and improved BIST diagnosis methods from combinatorial Group testing theory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3): 533-543 (2006)

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