"Fast Interval-Valued Statistical Modeling of Interconnect and Effective ..."

James D. Ma, Rob A. Rutenbar (2006)

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DOI: 10.1109/TCAD.2006.870067

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type: Journal Article

metadata version: 2024-03-22

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James D. Ma, Rob A. Rutenbar:
Fast Interval-Valued Statistical Modeling of Interconnect and Effective Capacitance. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(4): 710-724 (2006)

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