"Minimizing Test Time in Arithmetic Test-Pattern Generators With ..."

Salvador Manich, Lucas Garcia-Deiros, Joan Figueras (2007)

> Home

Details and statistics

DOI: 10.1109/TCAD.2007.906465

access: closed

type: Journal Article

metadata version: 2023-03-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/ManichGF07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/ManichGF07
Salvador Manich, Lucas Garcia-Deiros, Joan Figueras:
Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(11): 2046-2058 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.