Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Efficient Interconnect Test Patterns for Crosstalk and Static Faults."

Pyoungwoo Min et al. (2006)

> Home

Details and statistics

DOI: 10.1109/TCAD.2006.873899

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/MinYSBP06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/MinYSBP06
Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2605-2608 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.