"An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults ..."

Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (2020)

> Home

Details and statistics

DOI: 10.1109/TCAD.2019.2957364

access: closed

type: Journal Article

metadata version: 2020-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/WangGF20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/WangGF20
Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2990-2999 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.