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"EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew ..."
Grace Li Zhang et al. (2019)
- Grace Li Zhang, Bing Li, Yiyu Shi, Jiang Hu, Ulf Schlichtmann:
EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew Configuration Under Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(4): 705-718 (2019)
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