"Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory."

Peng Liu et al. (2021)

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DOI: 10.1109/TETC.2020.2982830

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type: Journal Article

metadata version: 2023-05-23

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Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han:
Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory. IEEE Trans. Emerg. Top. Comput. 9(2): 745-758 (2021)

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