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"A High-Efficient Measurement System With Optimization Feature for ..."
Miron Klosowski et al. (2018)
- Miron Klosowski
, Jacek Jakusz
, Waldemar Jendernalik
, Grzegorz Blakiewicz
, Stanislaw Szczepanski, Slawomir Koziel
:
A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors. IEEE Trans. Instrum. Meas. 67(10): 2363-2372 (2018)
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