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"Fault-based Built-in Self-test and Evaluation of Phase Locked Loops."

Mehmet Ince et al. (2021)

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DOI: 10.1145/3427911

access: closed

type: Journal Article

metadata version: 2021-03-16

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Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. 26(3): 20:1-20:18 (2021)

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