"A Memory-Efficient Unified Early Z-Test."

Hong-Yun Kim, Chang-Hyo Yu, Lee-Sup Kim (2011)

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DOI: 10.1109/TVCG.2010.228

access: closed

type: Journal Article

metadata version: 2018-11-14

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  - https://dblp.org/rec/journals/tvcg/KimYK11
Hong-Yun Kim, Chang-Hyo Yu, Lee-Sup Kim:
A Memory-Efficient Unified Early Z-Test. IEEE Trans. Vis. Comput. Graph. 17(9): 1286-1294 (2011)

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