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"Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based ..."

Ender Yilmaz, Sule Ozev, Kenneth M. Butler (2013)

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DOI: 10.1109/TVLSI.2012.2205027

access: closed

type: Journal Article

metadata version: 2020-03-11

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Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 21(6): 1116-1128 (2013)

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