Stop the war!
Остановите войну!
for scientists:
default search action
"Current Testing of CMOS Combinational Circuits with Single Floating Gate ..."
Víctor H. Champac, Joan Figueras (1997)
- Víctor H. Champac, Joan Figueras:
Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects. VLSI Design 5(3): 273-284 (1997)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.