• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 27 matches

• 2024
• 
  Harsh Vardhan, Umesh Timalsina, Michael Sandborn, David Hyde, Péter Völgyesi, Janos Sztipanovits:
  Anvil: An integration of artificial intelligence, sampling techniques, and a combined CAD-CFD tool. CoRR abs/2407.02519 (2024)
• 2023
• 
  Ray Islam, Peter Sandborn:
  Demonstration of a Response Time Based Remaining Useful Life (RUL) Prediction for Software Systems. CoRR abs/2307.12237 (2023)
• 2022
• 
  Peter Sandborn, William Lucyshyn:
  System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy Systems. World Scientific Series on Emerging Technologies 4, WorldScientific 2022, ISBN 9789811256844, pp. 1-388
• 
  Michael Sandborn, Carlos Olea, Anwar Said, Mudassir Shabbir, Péter Völgyesi, Xenofon D. Koutsoukos, Jules White:
  What a drag! Streamlining the UAV design process with design grammars and drag surrogates. CSCI 2022: 279-283
• 2015
• 
  Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang:
  A return on investment analysis of applying health monitoring to LED lighting systems. Microelectron. Reliab. 55(3-4): 527-537 (2015)
• 
  Edwin Lillie, Peter Sandborn, David Humphrey:
  Assessing the value of a lead-free solder control plan using cost-based FMEA. Microelectron. Reliab. 55(6): 969-979 (2015)
• 
  Peter A. Sandborn, Varun J. Prabhakar:
  The Forecasting and Impact of the Loss of Critical Human Skills Necessary for Supporting Legacy Systems. IEEE Trans. Engineering Management 62(3): 361-371 (2015)
• 
  Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour, Navid Goudarzi:
  PHM based predictive maintenance optimization for offshore wind farms. ICPHM 2015: 1-8
• 2013
• 
  Liyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn:
  Ontology-Based Knowledge Representation for Obsolescence Forecasting. J. Comput. Inf. Sci. Eng. 13(1) (2013)
• 2012
• 
  Varun J. Prabhakar, Peter Sandborn:
  A part total cost of ownership model for long life cycle electronic systems. Int. J. Comput. Integr. Manuf. 25(4-5): 384-397 (2012)
• 
  Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht:
  An Options Approach for Decision Support of Systems With Prognostic Capabilities. IEEE Trans. Reliab. 61(4): 872-883 (2012)
• 2011
• 
  Peter Sandborn, Varun J. Prabhakar, O. Ahmad:
  Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescence. Microelectron. Reliab. 51(2): 392-399 (2011)
• 2009
• 
  Kiri Feldman, Taoufik Jazouli, Peter Sandborn:
  A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management. IEEE Trans. Reliab. 58(2): 305-316 (2009)
• 2007
• 
  Peter Sandborn, Michael G. Pecht:
  Introduction to special section on electronic systems prognostics and health management. Microelectron. Reliab. 47(12): 1847-1848 (2007)
• 
  Peter A. Sandborn, Chris Wilkinson:
  A maintenance planning and business case development model for the application of prognostics and health management (PHM) to electronic systems. Microelectron. Reliab. 47(12): 1889-1901 (2007)
• 
  E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher:
  Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. Microelectron. Reliab. 47(12): 1857-1864 (2007)
• 2006
• 
  Zhen Shi, Peter Sandborn:
  Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. J. Electron. Test. 22(1): 49-60 (2006)
• 2005
• 
  Andre Kleyner, Peter Sandborn:
  A warranty forecasting model based on piecewise statistical distributions and stochastic simulation. Reliab. Eng. Syst. Saf. 88(3): 207-214 (2005)
• 2003
• 
  Zhen Shi, Peter Sandborn:
  Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. ITC 2003: 937-946
• 2002
• 
  Daniel Ragan, Peter Sandborn, Paul Stoaks:
  A detailed cost model for concurrent use with hardware/software co-design. DAC 2002: 269-274
• 2001
• 
  Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht:
  Process capability indices and product reliability. Microelectron. Reliab. 41(12): 2067-2070 (2001)
• 
  Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe:
  A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. ITC 2001: 1108-1117
• 1998
• 
  Peter Sandborn, Mike Vertal:
  Analyzing Packaging Trade-Offs During System Design. IEEE Des. Test Comput. 15(3): 10-19 (1998)
• 1997
• 
  Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn:
  Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electron. Test. 10(1-2): 151-166 (1997)
• 1994
• 
  Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake:
  Analyzing Multichip Module Testing Strategies. IEEE Des. Test Comput. 11(1): 40-52 (1994)
• 
  Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy:
  High Level Test Economics Advisor (Hi-TEA). J. Electron. Test. 5(2-3): 195-206 (1994)
• 
  Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh:
  Multichip systems trade-off analysis tool. J. Electron. Test. 5(2-3): 207-218 (1994)