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Publication search results
found 59 matches
- 2007
- Jaume Abella, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González:
Fuse: A Technique to Anticipate Failures due to Degradation in ALUs. IOLTS 2007: 15-22 - Osama Daifallah Al-Khaleel, Christos A. Papachristou, Francis G. Wolff, Kiamal Z. Pekmestzi:
An Elliptic Curve Cryptosystem Design Based on FPGA Pipeline Folding. IOLTS 2007: 71-78 - Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis:
A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs. IOLTS 2007: 271-276 - Costas Argyrides, Dhiraj K. Pradhan:
Highly Reliable Power Aware Memory Design. IOLTS 2007: 189-190 - Asen Asenov:
Statistical Device Variability and its Impact on Yield and Performance. IOLTS 2007: 253 - Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151 - Nikolaos G. Bartzoudis, Klaus D. McDonald-Maier:
Online monitoring of FPGA-based co-processing engines embedded in dependable workstations. IOLTS 2007: 79-84 - Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda:
A Hybrid Approach to Fault Detection and Correction in SoCs. IOLTS 2007: 107-112 - Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero:
An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores. IOLTS 2007: 265-270 - R. Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284 - Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard:
Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? IOLTS 2007: 63-70 - X. Cano, Sebastià A. Bota, Ricardo Graciani Diaz, David Gascon, A. Herms, Albert Comerma, Jaume Segura, Lluís Garrido:
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment. IOLTS 2007: 183-184 - Jacques Henri Collet, Piotr Zajac:
Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips. IOLTS 2007: 259 - Atefe Dalirsani, Mohammad Hosseinabady, Zainalabedin Navabi:
An Analytical Model for Reliability Evaluation of NoC Architectures. IOLTS 2007: 49-56 - Mark Derbey:
Soft-Errors Phenomenon Impacts on Design for Reliability Technologies. IOLTS 2007: 7 - Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel:
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. IOLTS 2007: 185-186 - Krisztián Flautner:
Blurring the Layers of Abstractions: Time to Take a Step Back? IOLTS 2007: 127 - Krisztián Flautner:
Architectural Trade-Offs for Fault Tolerant Multi-Core Systems. IOLTS 2007: 261 - K. T. Gardiner, Alexandre Yakovlev, Alexandre V. Bystrov:
A C-element Latch Scheme with Increased Transient Fault Tolerance for Asynchronous Circuits. IOLTS 2007: 223-230 - Manuel G. Gericota, Luís F. Lemos, Gustavo R. Alves, José M. Ferreira:
On-Line Self-Healing of Circuits Implemented on Reconfigurable FPGAs. IOLTS 2007: 217-222 - Swaroop Ghosh, Patrick Ndai, Swarup Bhunia, Kaushik Roy:
Tolerance to Small Delay Defects by Adaptive Clock Stretching. IOLTS 2007: 244-252 - Cristian Grecu, Lorena Anghel, Partha Pratim Pande, André Ivanov, Resve A. Saleh:
Essential Fault-Tolerance Metrics for NoC Infrastructures. IOLTS 2007: 37-42 - Tino Heijmen:
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. IOLTS 2007: 131-136 - Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 - John C. Liobe, Martin Margala:
Novel Process and Temperature-Stable BICS for Embedded Analog and Mixed-Signal Test. IOLTS 2007: 231-236 - T. M. Mak:
Infant Mortality--The Lesser Known Reliability Issue. IOLTS 2007: 122 - Riccardo Mariani, Gabriele Boschi:
A systematic approach for Failure Modes and Effects Analysis of System-On-Chips. IOLTS 2007: 187-188 - Jimson Mathew, Hafizur Rahaman, Dhiraj K. Pradhan:
Efficient Testable Bit Parallel Multipliers over GF(2m) with Constant Test set. IOLTS 2007: 207-208 - Subhasish Mitra:
Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. IOLTS 2007: 123 - Subhasish Mitra, Pia N. Sanda, Norbert Seifert:
Soft Errors: Technology Trends, System Effects, and Protection Techniques. IOLTS 2007: 4
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