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2020 – today
- 2022
[c9]Mu-Chun Wang, Zixuan Liu, Sheng Wang:
Textomics: A Dataset for Genomics Data Summary Generation. ACL (1) 2022: 4878-4891- [c8]Shuo Zhang, Mu-Chun Wang, Krisztian Balog:
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems. SIGIR 2022: 133-143 - [i1]Shuo Zhang, Mu-Chun Wang, Krisztian Balog:
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems. CoRR abs/2205.01763 (2022) - 2021
- [c7]Weibo Gao
, Qi Liu, Zhenya Huang, Yu Yin, Haoyang Bi, Mu-Chun Wang, Jianhui Ma, Shijin Wang, Yu Su:
RCD: Relation Map Driven Cognitive Diagnosis for Intelligent Education Systems. SIGIR 2021: 501-510 - 2020
- [c6]De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang:
Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. ICKII 2020: 1-3 - [c5]Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang:
Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress. ICKII 2020: 64-66 - [c4]Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang:
Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. ICKII 2020: 67-70 - [c3]Ying-Jun Deng, Hao-Lun Hu, Yu-Han Liang, Jian-Ming Chen, Ching-Chuan Chou, Shea-Jue Wang, Mu-Chun Wang:
Q-factor Integrity of 28nm-node High-k Gate Dielectric. ICKII 2020: 71-73
2010 – 2019
- 2018
- [j6]Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan:
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83: 260-270 (2018) - [j5]Shea-Jue Wang, Mu-Chun Wang, Shih-Fan Chen, Yu-Hsiang Li, Tien-Szu Shen, Hui-Yun Bor, Chao-Nan Wei:
Electrical and Physical Characteristics of WO3/Ag/WO3 Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †. Sensors 18(9): 2803 (2018) - 2015
- [j4]K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou:
Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics. Microelectron. Reliab. 55(11): 2198-2202 (2015) - [j3]Shea-Jue Wang, Mu-Chun Wang, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu:
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment. Microelectron. Reliab. 55(11): 2203-2207 (2015) - 2010
- [j2]Mu-Chun Wang, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin:
Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process. Microelectron. Reliab. 50(6): 839-846 (2010)
2000 – 2009
- 2009
- [j1]Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang:
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs. Microelectron. Reliab. 49(8): 892-896 (2009) - 2005
- [c2]Tsung-Hsiang Chang, Chien-Ju Ho, David Chawei Hsu, Yuan-Hsiang Lee, Min-Shieh Tsai, Mu-Chun Wang, Jane Yung-jen Hsu:
iCane - A Partner for the Visually Impaired. EUC Workshops 2005: 393-402 - 2001
- [c1]Ming-Dou Ker, Wen-Yu Lo, Tung-Yang Chen, Howard Tang, S.-S. Chen, Mu-Chun Wang:
Compact Layout Rule Extraction for Latchup Prevention in a 0.25-?m Shallow-Trench-Isolation Silicided Bulk CMOS Process. ISQED 2001: 267-272
Coauthor Index
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