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ORCIDWerner Kanert
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2010 – 2019
- 2014
[j10]Werner Kanert:
Robustness Validation - A physics of failure based approach to qualification. Microelectron. Reliab. 54(9-10): 1648-1654 (2014)- 2012
- [j9]Reinhard Pufall, Michael Goroll, Joachim Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek:
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests. Microelectron. Reliab. 52(7): 1266-1271 (2012) - [j8]Werner Kanert:
Active cycling reliability of power devices: Expectations and limitations. Microelectron. Reliab. 52(9-10): 2336-2341 (2012) - 2011
- [j7]Verena Müller, Horst Lewitschnig
, Nicoleta Kortik, Werner Kanert:
Quality assurance in automotive electronics. Elektrotech. Informationstechnik 128(10): 371-374 (2011)
2000 – 2009
- 2008
- [j6]Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll:
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48(8-9): 1490-1493 (2008) - 2007
- [j5]Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll:
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47(9-11): 1416-1418 (2007) - [j4]Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu:
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectron. Reliab. 47(9-11): 1512-1516 (2007) - 2006
- [j3]Michael Goroll, Werner Kanert, Reinhard Pufall:
ESD protection structure qualification - a new approach for release for automotive applications. Microelectron. Reliab. 46(9-11): 1648-1651 (2006) - 2004
- [j2]Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat:
Semiconductors in high temperature applications - a future trend in automotive industry. Microelectron. Reliab. 44(9-11): 1413-1417 (2004) - 2003
- [j1]Werner Kanert, H. Dettmer, Boris Plikat, Norbert Seliger:
Reliability aspects of semiconductor devices in high temperature applications. Microelectron. Reliab. 43(9-11): 1839-1846 (2003)
Coauthor Index
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