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ORCIDAlexander Axelevitch
Person information
- affiliation: Holon Institute of Technology, Holon, Israel
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2010 – 2019
- 2015
[c1]Alexander Axelevitch, Vasilisa Akselevich:
Evaluation of the neuropeptides level using a surface enhanced mobile spectroscopy system. MFI 2015: 334-338- 2011
- [j9]Alex Axelevitch, B. Gorenstein, Gady Golan
:
Investigation of the electrical transport mechanism in VOx thin films. Microelectron. Reliab. 51(12): 2119-2123 (2011)
2000 – 2009
- 2009
- [j8]Alex Axelevitch, Gady Golan:
Novel silicon high sensitive photonic sensor. Microelectron. J. 40(3): 435-438 (2009) - 2006
- [j7]Gady Golan, Alex Axelevitch:
Progress in vacuum photothermal processing (VPP). Microelectron. J. 37(5): 459-473 (2006) - [j6]Gady Golan, Alex Axelevitch, B. Gorenstein, V. Manevych:
Hot-Probe method for evaluation of impurities concentration in semiconductors. Microelectron. J. 37(9): 910-915 (2006) - [j5]Gady Golan, Alex Axelevitch, B. Gorenstein:
Si-C multilayer quasi crystals preparation by DC magnetron sputtering. Microelectron. J. 37(12): 1538-1542 (2006) - 2003
- [j4]Gady Golan, Alex Axelevitch, B. Sigalov, B. Gorenstein:
Metal-insulator phase transition in vanadium oxides films. Microelectron. J. 34(4): 255-258 (2003) - [j3]Gady Golan, Alex Axelevitch, B. Sigalov, B. Gorenstein:
Integrated thin film heater-thermocouple systems. Microelectron. Reliab. 43(3): 509-512 (2003) - 2001
- [j2]Gady Golan, E. Rabinovich, A. Inberg, Alex Axelevitch, Gennady Lubarsky, Pier Giorgio Rancoita, M. Demarchi, A. Seidman, Nathan Croitoru:
Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectron. Reliab. 41(1): 67-72 (2001) - [j1]Gady Golan, Alex Axelevitch, E. Rabinovitch:
Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts. Microelectron. Reliab. 41(6): 871-879 (2001)
Coauthor Index
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