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Rene Krenz-Baath
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2020 – today
- 2024
- [j2]Joseline Heuer
, Rene Krenz-Baath, Roman Obermaisser:
Human-heart-model for hardware-in-the-loop testing of pacemakers. Comput. Biol. Medicine 180: 108966 (2024) - 2023
- [c17]Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser:
Verifying Bio-Electronic Systems. DDECS 2023: 161-166
2010 – 2019
- 2017
- [c16]Artur Jutman
, Christophe Lotz, Erik Larsson
, Matteo Sonza Reorda
, Maksim Jenihhin
, Jaan Raik
, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke:
BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE 2017: 115-120 - 2016
- [j1]Stephan Eggersglüß
, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
:
On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(12): 2104-2117 (2016) - [c15]Anton Tsertov
, Artur Jutman
, Sergei Devadze
, Matteo Sonza Reorda
, Erik Larsson
, Farrokh Ghani Zadegan
, Riccardo Cantoro
, Mehrdad Montazeri, Rene Krenz-Baath:
A suite of IEEE 1687 benchmark networks. ITC 2016: 1-10 - [c14]Farrokh Ghani Zadegan
, Rene Krenz-Baath, Erik Larsson
:
Upper-bound computation for optimal retargeting in IEEE1687 networks. ITC 2016: 1-10 - [c13]Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser:
Computing optimal communication schedules for time-triggered networks using an SMT solver. SIES 2016: 83-91 - 2015
- [c12]Rene Krenz-Baath, Farrokh Ghani Zadegan
, Erik Larsson
:
Access time minimization in IEEE 1687 networks. ITC 2015: 1-10 - [c11]Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser:
Optimal SAT-based scheduler for time-triggered networks-on-a-chip. SIES 2015: 156-161 - 2014
- [c10]Farrokh Ghani Zadegan
, Erik Larsson
, Artur Jutman
, Sergei Devadze
, Rene Krenz-Baath:
Design, Verification, and Application of IEEE 1687. ATS 2014: 93-100 - [c9]Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
:
Optimization-based multiple target test generation for highly compacted test sets. ETS 2014: 1-6 - 2013
- [c8]Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke:
Fault collapsing of multi-conditional faults. DDECS 2013: 42-47 - [c7]Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath:
Industrial Application of IEEE P1687 for an Automotive Product. DSD 2013: 453-461 - 2012
- [c6]Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
:
A new SAT-based ATPG for generating highly compacted test sets. DDECS 2012: 230-235 - [c5]Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz:
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD 2012: 823-829 - 2010
- [c4]Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler
:
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. ETS 2010: 176-181 - [c3]Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger:
Defect-oriented cell-internal testing. ITC 2010: 285-294
2000 – 2009
- 2009
- [c2]Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - 2007
- [c1]Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel:
Computation and Application of Absolute Dominators in Industrial Designs. ETS 2007: 137-144
Coauthor Index
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last updated on 2024-09-10 01:15 CEST by the dblp team
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