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2020 – today
- 2024
[c4]Jannik H. Schwarberg
, Robin Karhu, Birgit Kallinger, Mathias Rommel, Robin Schmidt, Jörg Schulze:
Investigation of CMOS Single Process Steps on 4H-SiC a-Plane Wafers for Quantum Applications. MIPRO 2024: 1566-1572- 2023
- [j5]Nicola J. Rinaldi, Rosalba Liguori, Alexander May, Chiara Rossi, Mathias Rommel, Alfredo Rubino, Gian Domenico Licciardo, Luigi Di Benedetto:
A 4H-SiC CMOS Oscillator-Based Temperature Sensor Operating from 298 K up to 573 K. Sensors 23(24): 9653 (2023) - [c3]Yunfan Niu, Jiarui Mo, Alexander May, Mathias Rommel, Chiara Rossi, Joost Romijn, Guoqi Zhang, Sten Vollebregt:
Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications. SENSORS 2023: 1-4 - [c2]Nicola J. Rinaldi, Gian Domenico Licciardo, Luigi Di Benedetto, Mathias Rommel, Tobias Erlbacher:
A DC SPICE Level 3 Model for 4H-SiC lateral NMOSFET under strong inversion conditions. PRIME 2023: 233-236
2010 – 2019
- 2018
- [j4]T. H. Nouibat, Zitouni Messai, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey:
Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectron. Reliab. 91: 183-187 (2018) - 2017
- [j3]Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann:
Waveguide Bragg Gratings in Ormocer®s for Temperature Sensing. Sensors 17(11): 2459 (2017) - 2015
- [j2]N. Rouag, Zahir Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey:
Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectron. Reliab. 55(7): 1028-1034 (2015) - 2013
- [c1]Moritz Hackenberg, Mathias Rommel, Maximilian Rumler, Jürgen Lorenz, Peter Pichler, Karim Huet, Razvan Negru, Giuseppe Fisicaro, Antonino La Magna, Nadjib Taleb, Maurice Quillec:
Melt depth and time variations during pulsed laser thermal annealing with one and more pulses. ESSDERC 2013: 214-217
2000 – 2009
- 2007
- [j1]Mathias Rommel, Anton J. Bauer, Heiner Ryssel:
Quantitative oxide charge determination by photocurrent analysis. Microelectron. Reliab. 47(4-5): 673-677 (2007)
Coauthor Index
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