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ORCIDMervi Paulasto-Kröckel
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2010 – 2019
- 2017
[j10]Glenn Ross
, Vesa Vuorinen, Michael Krause, S. Reissaus, Matthias Petzold, Mervi Paulasto-Kröckel:
XRD and ToF-SIMS study of intermetallic void formation in Cu-Sn micro-connects. Microelectron. Reliab. 76-77: 390-394 (2017)- 2016
- [j9]Vesa Vuorinen, Antti Rautiainen, Hannele Heikkinen, Mervi Paulasto-Kröckel:
Optimization of contact metallizations for reliable wafer level AuSn bonds. Microelectron. Reliab. 64: 676-680 (2016) - 2014
- [j8]Jue Li, Mikael Broas, Jani Raami, Toni T. Mattila, Mervi Paulasto-Kröckel:
Reliability assessment of a MEMS microphone under mixed flowing gas environment and shock impact loading. Microelectron. Reliab. 54(6-7): 1228-1234 (2014) - 2013
- [j7]Antti G. Ritvanen, Marcelo Elias de Oliveira, Mika P. Koivikko, Harri O. Hallila, Juha K. Haaja, Virve S. Koljonen, Junnu P. Leikola, Jyri J. Hukki, Mervi Paulasto-Kröckel:
Mesh-based method for measuring intracranial volume in patients with craniosynostosis. Int. J. Comput. Assist. Radiol. Surg. 8(5): 703-709 (2013) - [c1]Emilia Kaivosoja, Emilia Berg, Antti Rautiainen, Tommi Palomäki, Jari Koskinen, Mervi Paulasto-Kröckel, Tomi Laurila:
Improving the function of dopamine electrodes with novel carbon materials. EMBC 2013: 632-634 - 2012
- [j6]Juha Karppinen, Jue Li, J. Pakarinen, Toni T. Mattila, Mervi Paulasto-Kröckel:
Shock impact reliability characterization of a handheld product in accelerated tests and use environment. Microelectron. Reliab. 52(1): 190-198 (2012) - [j5]Jussi Hokka, Jue Li, Toni T. Mattila, Mervi Paulasto-Kröckel:
The reliability of component boards studied with different shock impact repetition frequencies. Microelectron. Reliab. 52(7): 1445-1453 (2012) - [j4]Jue Li, Markus Turunen, Sini Niiranen, Hongtao Chen, Mervi Paulasto-Kröckel:
A reliability study of adhesion mechanism between liquid crystal polymer and silicone adhesive. Microelectron. Reliab. 52(12): 2962-2969 (2012) - 2011
- [j3]Toni T. Mattila, Mervi Paulasto-Kröckel:
Toward comprehensive reliability assessment of electronics by a combined loading approach. Microelectron. Reliab. 51(6): 1077-1091 (2011) - 2010
- [j2]Juha Karppinen, Jue Li, Toni T. Mattila, Mervi Paulasto-Kröckel:
Thermomechanical reliability characterization of a handheld product in accelerated tests and use environment. Microelectron. Reliab. 50(12): 1994-2000 (2010) - [j1]J. Li, Toni T. Mattila, H. Xu, Mervi Paulasto:
FEM simulations for reliability assessment of component boards drop tested at various temperatures. Simul. Model. Pract. Theory 18(9): 1355-1364 (2010)
Coauthor Index
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