"Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: ..."

M. Houssa et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.10.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Houssa, Marc Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns:
Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectron. Reliab. 47(6): 880-889 (2007)

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