"Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized ..."

Sabyasachi Deyati, Barry J. Muldrey, Abhijit Chatterjee (2020)

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DOI: 10.1109/TCAD.2019.2948902

access: closed

type: Journal Article

metadata version: 2020-10-06

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Sabyasachi Deyati, Barry J. Muldrey, Abhijit Chatterjee:
Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2006-2019 (2020)

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