• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 68 matches

• 2023
• 
  Bapi Vinnakota, John M. Shalf:
  Modular High-Performance Computing Using Chiplets. Comput. Sci. Eng. 25(6): 39-48 (2023)
• 
  Bapi Vinnakota, Jaber Derakhshandeh, Eric Beyne, Erik Jan Marinissen, Sreejit Chakravarty:
  IP Session on Chiplet: Design, Assembly, and Test. VTS 2023: 1
• 2022
• 
  Vivek Raghunathan, Karl Muth, Bapiraju Vinnakota, Prasad Venugopal, Rebecca Schaevitz, Manish Mehta:
  SCIP to the Next Generation of Computing: Extending More than Moore with Silicon Photonics Chiplets in Package (SCIP). ISQED 2022: 1-6
• 2021
• 
  Shahab Ardalan, Ramin Farjadrad, Mark Kuemerle, Ken Poulton, Suresh Subramaniam, Bapiraju Vinnakota:
  An Open Inter-Chiplet Communication Link: Bunch of Wires (BoW). IEEE Micro 41(1): 54-60 (2021)
• 
  Bapiraju Vinnakota, Ishwar Agarwal, Kevin Drucker, Dharmesh Jani, Gary Miller, Millind Mittal, Robert Wang:
  The Open Domain-Specific Architecture. IEEE Micro 41(1): 30-36 (2021)
• 
  Bapiraju Vinnakota:
  The Open Domain-Specific Architecture: Next Steps to Production. NANOCOM 2021: 19:1-19:5
• 
  Bapi Vinnakota:
  The Open Domain-Specific Architecture: An Introduction (Invited). SLIP 2021: 43
• 2020
• 
  Ramin Farjadrad, Mark Kuemerle, Bapi Vinnakota:
  A Bunch-of-Wires (BoW) Interface for Interchiplet Communication. IEEE Micro 40(1): 15-24 (2020)
• 
  Shahab Ardalan, Halil Cirit, Ramin Farjad-Rad, Mark Kuemerle, Ken Poulton, Suresh Subramanian, Bapiraju Vinnakota:
  Bunch of Wires: An Open Die-to-Die Interface. Hot Interconnects 2020: 9-16
• 
  Kevin Drucker, Dharmesh Jani, Ishwar Agarwal, Gary Miller, Millind Mittal, Robert Wang, Bapiraju Vinnakota:
  The Open Domain-Specific Architecture. Hot Interconnects 2020: 25-32
• 
  Marc Hutner, R. Sethuram, Bapi Vinnakota, Dave Armstrong, A. Copperhall:
  Special Session: Test Challenges in a Chiplet Marketplace. VTS 2020: 1-12
• 2019
• 
  Ramin Farjadrad, Bapiraju Vinnakota:
  A Bunch of Wires (BoW) Interface for Inter-Chiplet Communication. Hot Interconnects 2019: 27-273
• 
  Greg Taylor, Ramin Farjadrad, Bapiraju Vinnakota:
  High Capacity On-Package Physical Link Considerations. Hot Interconnects 2019: 19-22
• 2010
• 
  Mehdi Baradaran Tahoori, Ishwar Parulkar, Dan Alexandrescu, Kevin Granlund, Allan Silburt, Bapi Vinnakota:
  Panel: Reliability of data centers: Hardware vs. software. DATE 2010: 1620
• 2009
• 
  Amit P. Jardosh, Konstantina Papagiannaki, Elizabeth M. Belding, Kevin C. Almeroth, Gianluca Iannaccone, Bapi Vinnakota:
  Green WLANs: On-Demand WLAN Infrastructures. Mob. Networks Appl. 14(6): 798-814 (2009)
• 2007
• 
  Amit P. Jardosh, Gianluca Iannaccone, Konstantina Papagiannaki, Bapi Vinnakota:
  Towards an Energy-Star WLAN Infrastructure. HotMobile 2007: 85-90
• 2004
• 
  Wooyoung Choi, Bapiraju Vinnakota, Ramesh Harjani:
  A digital DFT technique for verifying the static performance of A/D converters. CICC 2004: 207-210
• 
  Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota:
  Combining dictionary coding and LFSR reseeding for test data compression. DAC 2004: 944-947
• 2003
• 
  Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota:
  Test Vector Generation Based on Correlation Model for Ratio-Iddq. ITC 2003: 545-554
• 
  Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota:
  Development of Energy Consumption Ratio Test. VTS 2003: 279-286
• 2002
• 
  Wanli Jiang, Bapiraju Vinnakota:
  Statistical threshold formulation for dynamic I_dd test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 694-705 (2002)
• 2001
• 
  Wanli Jiang, Bapiraju Vinnakota:
  Defect-oriented test scheduling. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 427-438 (2001)
• 
  Xiaoyun Sun, Seonki Kim, Bapiraju Vinnakota:
  Crosstalk Fault Detection by Dynamic Idd. ICCAD 2001: 375-
• 
  Amit K. Varshney, Bapiraju Vinnakota, Eric Skuldt, Brion L. Keller:
  High Performance Parallel Fault Simulation. ICCD 2001: 308-313
• 
  Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota:
  Non-ideal amplifier effects on the accuracy of analog-to-digital capacitor ratio converter. ISCAS (1) 2001: 552-555
• 
  Xiaoyun Sun, Bapiraju Vinnakota:
  Current Measurement for Dynamic Idd Test. VTS 2001: 117-123
• 2000
• 
  Wanli Jiang, Bapiraju Vinnakota:
  IC test using the energy consumption ratio. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(1): 129-141 (2000)
• 
  Bapiraju Vinnakota, Ramesh Harjani:
  DFT for digital detection of analog parametric faults in SC filters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(7): 789-798 (2000)
• 
  Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota:
  Optimal test-set generation for parametric fault detection in switched capacitor filters. Asian Test Symposium 2000: 72-77
• 
  Seonki Kim, Bapiraju Vinnakota:
  Fast Test Application Technique Without Fast Scan Clocks. ICCAD 2000: 464-467

skipping 38 more matches