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Kris Vanstreels
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2010 – 2019
- 2015
- [c1]Joke De Messemaeker, O. Varela Pedreira
, A. Moussa, Nabi Nabiollahi, Kris Vanstreels, Stefaan Van Huylenbroeck, Harold Philipsen
, Patrick Verdonck, Bart Vandevelde, Ingrid De Wolf, Eric Beyne
, Kris Croes:
Impact of oxide liner properties on TSV Cu pumping and TSV stress. IRPS 2015: 4 - 2014
- [j7]Bart Vandevelde, Andrej Ivankovic, B. Debecker, Melina Lofrano, Kris Vanstreels, Wei Guo, Vladimir Cherman, Marcel Gonzalez, Geert Van der Plas, Ingrid De Wolf, Eric Beyne
, Zsolt Tokei
:
Chip-Package Interaction in 3D stacked IC packages using Finite Element Modelling. Microelectron. Reliab. 54(6-7): 1200-1205 (2014) - [j6]Yun-Hsuan Chen
, Maaike Op de Beeck, Luc Vanderheyden, Evelien Carrette
, Vojkan Mihajlovic, Kris Vanstreels, Bernard Grundlehner
, Stefanie Gadeyne
, Paul Boon
, Chris Van Hoof
:
Soft, Comfortable Polymer Dry Electrodes for High Quality ECG and EEG Recording. Sensors 14(12): 23758-23780 (2014) - 2012
- [j5]Biljana Dimcic, Riet Labie, Joke De Messemaeker, Kris Vanstreels, Kris Croes, Bert Verlinden, Ingrid De Wolf:
Diffusion growth of Cu3Sn phase in the bump and thin film Cu/Sn structures. Microelectron. Reliab. 52(9-10): 1971-1974 (2012) - [j4]Andrej Ivankovic, Kris Vanstreels, Daniel Vanderstraeten, Guy Brizar, Renaud Gillon
, Eddy Blansaer, Bart Vandevelde:
Comparison of experimental methods for the extraction of the elastic modulus of molding compounds used in IC packaging. Microelectron. Reliab. 52(11): 2677-2684 (2012) - 2011
- [j3]Ingrid De Wolf, Kris Croes, O. Varela Pedreira
, Riet Labie, Augusto Redolfi, M. Van De Peer, Kris Vanstreels, C. Okoro, Bart Vandevelde, Eric Beyne
:
Cu pumping in TSVs: Effect of pre-CMP thermal budget. Microelectron. Reliab. 51(9-11): 1856-1859 (2011)
2000 – 2009
- 2005
- [j2]Kris Vanstreels, Marc D'Olieslaeger
, Ward De Ceuninck, Jan D'Haen
, Karen Maex:
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45(3-4): 753-759 (2005) - 2004
- [j1]Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen
, Ward De Ceuninck, Marc D'Olieslaeger
:
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44(9-11): 1849-1854 (2004)
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