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ORCIDWard De Ceuninck
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2010 – 2019
- 2018
[c2]Philippe Nivelle, Tom Borgers, Eszter Voroshazi
, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen:
Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules. IRPS 2018: 6- 2017
- [j17]Thijs Vandenryt, Bart van Grinsven, Kasper Eersels, Peter Cornelis, Safira Kholwadia, Thomas Cleij, Ronald Thoelen, Ward De Ceuninck, Marloes Peeters, Patrick H. Wagner:
Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic Receptors. Sensors 17(12): 2701 (2017) - 2014
- [j16]Gideon Wackers, Thijs Vandenryt, Peter Cornelis, Evelien Kellens, Ronald Thoelen, Ward De Ceuninck, Patricia Losada-Pérez, Bart van Grinsven, Marloes Peeters, Patrick H. Wagner:
Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted Polymers. Sensors 14(6): 11016-11030 (2014) - 2013
- [j15]Bram Geerets, Marloes Peeters, Bart van Grinsven, Karolien Bers, Ward De Ceuninck, Patrick H. Wagner:
Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection Limits. Sensors 13(7): 9148-9159 (2013) - [j14]Thijs Vandenryt, Andrea Pohl, Bart van Grinsven, Ronald Thoelen, Ward De Ceuninck, Patrick H. Wagner, Jörg Opitz:
Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface Interactions. Sensors 13(11): 14650-14661 (2013) - 2012
- [c1]Jeroen Broeders, Dieter Croux, Ans Weustenraed, Thomas Cleij, Patrick H. Wagner, Ward De Ceuninck, Wouter Vanaken, Stijn Duchateau, Ronald Thoelen:
Embedded Unit for Point-of-Care Impedance Based Biosensor Readout. HPCC-ICESS 2012: 1571-1577
2000 – 2009
- 2007
- [j13]R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen:
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47(9-11): 1389-1393 (2007) - 2005
- [j12]Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex:
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45(3-4): 753-759 (2005) - 2004
- [j11]Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot:
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44(9-11): 1621-1624 (2004) - [j10]Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger:
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44(9-11): 1849-1854 (2004) - 2003
- [j9]Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen:
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43(9-11): 1483-1488 (2003) - [j8]Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne:
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43(9-11): 1785-1790 (2003) - 2002
- [j7]Luc Tielemans, R. Rongen, Ward De Ceuninck:
How reliable are reliability tests? Microelectron. Reliab. 42(9-11): 1339-1345 (2002) - [j6]R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons:
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectron. Reliab. 42(9-11): 1359-1363 (2002) - [j5]E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42(9-11): 1409-1413 (2002) - [j4]Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger:
High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectron. Reliab. 42(9-11): 1485-1489 (2002) - 2001
- [j3]R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken:
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41(3): 437-443 (2001) - [j2]Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel:
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41(9-10): 1439-1442 (2001) - [j1]R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons:
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. Microelectron. Reliab. 41(9-10): 1591-1596 (2001)
Coauthor Index
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